| Optical properties of single-wall carbon nanotube films deposited on Si/SiO 2 wafers H Soetedjo, MF Mora, CD Garcia Thin Solid Films 518 (14), 3954-3959 (WoS./Thomson R.) IF=1.9, 2010 | 45 | 2010 |
| Deposition of Cu-doped PbS thin films with low resistivity using DC sputtering H Soetedjo, B Siswanto, I Aziz, Sudjatmoko Results in Physics, Vol 9 (Thomson Reuters/Web of Science), IF =2.147, 2018 | 19 | 2018 |
| LOW RESISTIVITY OF Cu- AND Fe-DOPED PbS THIN FILMS PREPARED USING DC SPUTTERING TECHNIQUE H Soetedjo, B Siswanto, I Aziz, Sudjatmoko Journal of Non-Oxide Glasses (Thomson R/Web of Science) 9 (2), 55-63, 2017 | 12 | 2017 |
| Use of a modified Drude's equation to investigate the optical rotation property of sugars H Soetedjo, J Räty Optik-Int. J.Light and Electron Optics 125 (24), 7162-7165 (Web of Sci …, 2014 | 10 | 2014 |
| Use of the Maximum Torque Sensor to Reduce the Starting Current in the Induction Motor Muchlas, H Soetedjo Sensors & Transducers 114 (3), 161 (SJR), 2010 | 7* | 2010 |
| Photoconductive phenomenon observed from ZnS layer deposition for a potential of IR sensor applications H Soetedjo, GS Prabowo Sensors & Transducers 123 (12), 100 (SJR), 2010 | 6 | 2010 |
| Reflectometric Study of contaminant layer on a probe window H Soetedjo, J Räty Applied spectroscopy 57 (8), 915-919 (Web of Sci/Thomson R) IF=1.39, 2003 | 6 | 2003 |
| Measurement of the degree of polarisation of thermally modified Scots pine using a Stokes imaging polarimeter I Niskanen, R Jukka, H Soetedjo, H Kenichi, O Hiroshi, H Rauno, ... Optical review, 2020 | 4 | 2020 |
| Determining the degree of heat treatment of wood by light polarization technique S Hariyadi, I Niskanen, L Rautkari, M Altgen, E Hiltunen, G Thungström, ... European Journal of Wood and Wood Products (Thomson Reuters/Web of Science …, 2018 | 4* | 2018 |
| Development of SiC/MgO distributed Bragg reflector using RF magnetron sputtering technique MSK Anuar, H Soetedjo, AM Sharizal, SM Sufian, TG Boon, R Richard, ... 2006 IEEE International Conference on Semiconductor Electronics, 378-381, 2006 | 4 | 2006 |
| Current–voltage behavior of AlGaAs/InGaAs pHEMT structures and the effect of optical illumination H Soetedjo, OM Nizam, I Sabtu, JM Sazli, A Yusof, YM Razman, AFA Mat Microelectronics journal 37 (6), 480-482 (Web of Sci/Thomson R) IF=0.80, 2006 | 4 | 2006 |
| Specific features of Hall effect in capped multilayer pHEMT structure of Al x Ga 1− x As/In x Ga 1− x As/GaAs H Soetedjo, MS Jusoh, I Sabtu, MR Yahya, AFA Mat Materials Letters 59 (29), 3810-3812 (Web of Sci/Thomson R) IF=1.19, 2005 | 4 | 2005 |
| Effect of Light Illumination on Leaves Movement of Mimosa pudica H Soetedjo, B Haryadi, D Taspyanto Applied Mechanics and Materials 771, 63-67 (SJR), 2015 | 3 | 2015 |
| Detections of water content changes in a nitrocellulose membrane based on polarized reflection spectroscopy H Soetedjo Sensors & Transducers 125 (2), 100 (SJR), 2011 | 3 | 2011 |
| DOE study on etching rate of silicon nitride (Si3N4) layer via RIE nitride etching process NH Ghazali, H Soetedjo, NA Ngah, A Yusof, A Dolah, MR Yahya 2008 IEEE International Conference on Semiconductor Electronics, 649-652, 2008 | 3 | 2008 |
| BIOMIMETIC PHOTODIODE DEVICE WITH LARGE PHOTOCURRENT RESPONSE USING PHOTOSYNTHETIC PIGMENT-PROTEIN COMPLEXES DY Kusuma, H Soetedjo Jurnal Neutrino 9 (2), 26-31, 2017 | 2 | 2017 |
| Insertion Layer in a Mid-Ir Band-Pass Filter Structure to Improve Optical Transmittance H Soetedjo, GS Prabowo Journal of Natural Sciences Research 2, 1, 2013 | 2* | 2013 |
| Use of Optical reflectometry to observe various concentrations of glucose H Soetedjo American Journal of Applied Sciences 8 (5), 463 (SJR), 2011 | 2 | 2011 |
| A design of simple, portable optical tomography apparatus using 904nm NIR laser diode M Sasono, H Soetedjo Optik-Int. J. Light and Electron Optics 121 (15), 1418-1422 (Web of Sci …, 2010 | 2 | 2010 |
| Device Characteristics of HEMT Structures based on Backgate Contact Method MNF Idham, ON Afzan, H Soetedjo, ARA Ismat, I Sabtu, YM Razman, ... 2006 IEEE International Conference on Semiconductor Electronics, 740-742, 2006 | 2 | 2006 |
