Monitoring oxygen production on mass-selected iridium–tantalum oxide electrocatalysts YR Zheng, J Vernieres, Z Wang, K Zhang, D Hochfilzer, K Krempl, ... Nature Energy 7 (1), 55-64, 2022 | 125 | 2022 |
Single atom detection from low contrast-to-noise ratio electron microscopy images J Fatermans, AJ den Dekker, K Müller-Caspary, I Lobato, CM O’Leary, ... Physical review letters 121 (5), 056101, 2018 | 42 | 2018 |
Coupling charge and topological reconstructions at polar oxide interfaces TC van Thiel, W Brzezicki, C Autieri, JR Hortensius, D Afanasiev, ... Physical Review Letters 127 (12), 127202, 2021 | 27 | 2021 |
The maximum a posteriori probability rule for atom column detection from HAADF STEM images J Fatermans, S Van Aert, AJ den Dekker Ultramicroscopy 201, 81-91, 2019 | 22 | 2019 |
Atom column detection from simultaneously acquired ABF and ADF STEM images J Fatermans, AJ den Dekker, K Müller-Caspary, N Gauquelin, J Verbeeck, ... Ultramicroscopy 219, 113046, 2020 | 19 | 2020 |
Co valence transformation in isopolar perovskite heterostructures via interfacial engineering G Araizi-Kanoutas, J Geessinck, N Gauquelin, S Smit, XH Verbeek, ... Physical Review Materials 4 (2), 026001, 2020 | 16 | 2020 |
Chapter Six - Atom column detection J Fatermans, A De Backer, AJ den Dekker, S Van Aert Advances in Imaging and Electron Physics 217, 177-214, 2021 | 3 | 2021 |
Chapter Two - Statistical parameter estimation theory: principles and simulation studies A De Backer, J Fatermans, AJ den Dekker, S Van Aert Advances in Imaging and Electron Physics 217, 29-72, 2021 | 3* | 2021 |
Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites J Fatermans, G Romolini, T Altantzis, J Hofkens, MBJ Roeffaers, S Bals, ... Nanoscale 14 (26), 9323-9330, 2022 | 2 | 2022 |
Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images A De Backer, J Fatermans, J Arnold, S Van Aert Advances in Imaging and Electron Physics 217, 145-175, 2021 | 1* | 2021 |
Chapter Four - Atom counting A De Backer, J Fatermans, AJ den Dekker, S Van Aert Advances in Imaging and Electron Physics 217, 91-144, 2021 | 1* | 2021 |
Atom column detection from STEM images using the maximum a posteriori probability rule J Fatermans, AJ den Dekker, CM O'Leary, PD Nellist, S Van Aert Microscopy Conference (MC) 2019, 2019 | 1 | 2019 |
Detection of atomic columns from noisy STEM images J Fatermans, K Müller-Caspary, AJ den Dekker, S Van Aert Microscopy Conference (MC) 2017, 2017 | 1 | 2017 |
Detecting atoms from low-dose STEM images J Fatermans, AJ den Dekker, K Müller-Caspary, N Gauquelin, J Verbeeck, ... Imaging & Microscopy 23, 33-35, 2021 | | 2021 |
Chapter One - Introduction A De Backer, J Fatermans, AJ den Dekker, S Van Aert Advances in Imaging and Electron Physics 217, 1-28, 2021 | | 2021 |
Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability J Fatermans, A De Backer, AJ den Dekker, S Van Aert Advances in Imaging and Electron Physics 217, 215-242, 2021 | | 2021 |
Chapter Eight - General conclusions and future perspectives A De Backer, J Fatermans, AJ den Dekker, S Van Aert Advances in Imaging and Electron Physics 217, 243-253, 2021 | | 2021 |
Chapter Three - Efficient fitting algorithm A De Backer, J Fatermans, AJ den Dekker, S Van Aert Advances in Imaging and Electron Physics 217, 73-90, 2021 | | 2021 |
Bayesian model selection for atom column detection from ABF-ADF STEM images J Fatermans, AJ den Dekker, N Gauquelin, J Verbeeck, S Van Aert Virtual Early Career European Microscopy Congress (EMC) 2020, 2020 | | 2020 |
Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM S Van Aert, A De Backer, A De wael, J Fatermans, E Arslan Irmak, ... Virtual MRS Spring/Fall Meeting, 2020 | | 2020 |