| On the development of intelligent optical inspections J Richter, D Streitferdt, E Rozova 2017 IEEE 7th Annual Computing and Communication Workshop and Conference …, 2017 | 47 | 2017 |
| Modern architecture for deep learning-based automatic optical inspection J Richter, D Streitferdt 2019 IEEE 43rd Annual Computer Software and Applications Conference (COMPSAC …, 2019 | 9 | 2019 |
| Deep learning based fault correction in 3D measurements of printed circuit boards J Richter, D Streitferdt 2018 IEEE 9th Annual Information Technology, Electronics and Mobile …, 2018 | 6 | 2018 |
| Simulating the printed circuit board assembly process for image generation J Nau, J Richter, D Streitferdt, M Kirchhoff 2020 IEEE 44th Annual Computers, Software, and Applications Conference …, 2020 | 3 | 2020 |
| Three-dimensional THT solder joint reconstruction for inline inspection systems J Richter, J Schambach Photonics and Education in Measurement Science 2019 11144, 83-89, 2019 | 3 | 2019 |
| On the development of a unified online laboratory framework J Nau, J Richter, D Streitferdt, K Henke, RN Bock, A Mitschele-Thiel Online Engineering and Society 4.0: Proceedings of the 18th International …, 2022 | 2 | 2022 |
| Improving the optical inspection of through hole resistors with additional spectral illuminations J Richter, D Streitferdt, E Rozova, M Kirchhoff 2017 8th IEEE Annual Information Technology, Electronics and Mobile …, 2017 | 2 | 2017 |
| Transparency and traceability for ai-based defect detection in pcb production A Rezaei, J Richter, J Nau, D Streitferdt, M Kirchhoff International Conference on Modelling and Development of Intelligent Systems …, 2022 | 1 | 2022 |
| NDE for Electronics Packaging M Oppermann, J Richter, J Schambach, N Meyendorf Handbook of Nondestructive Evaluation 4.0, 1-51, 2021 | 1 | 2021 |
| KOI: An Architecture and Framework for Industrial and Academic Machine Learning Applications J Richter, J Nau, M Kirchhoff, D Streitferdt International Conference on Modelling and Development of Intelligent Systems …, 2021 | 1 | 2021 |
| FACEE: Framework for Automating CNN Explainability Evaluation A Rezaei, J Nau, J Richter, D Streitferdt, J Schambach 2023 IEEE 47th Annual Computers, Software, and Applications Conference …, 2023 | | 2023 |
| Analyse und Entwicklung einer Softwarearchitektur für die intelligente, optische Inspektion J Richter BoD–Books on Demand, 2023 | | 2023 |
Detlef StreitferdtTechnische Universität IlmenauVerified email at tu-ilmenau.de
