The end of moore's law: A new beginning for information technology TN Theis, HSP Wong
Computing in science & engineering 19 (2), 41-50, 2017
917 2017 Electroluminescence studies in silicon dioxide films containing tiny silicon islands DJ DiMaria, JR Kirtley, EJ Pakulis, DW Dong, TS Kuan, FL Pesavento, ...
Journal of Applied Physics 56 (2), 401-416, 1984
446 1984 Theory of high-field electron transport in silicon dioxide MV Fischetti, DJ DiMaria, SD Brorson, TN Theis, JR Kirtley
Physical Review B 31 (12), 8124, 1985
346 1985 It’s time to reinvent the transistor! TN Theis, PM Solomon
Science 327 (5973), 1600-1601, 2010
300 2010 In quest of the “next switch”: prospects for greatly reduced power dissipation in a successor to the silicon field-effect transistor TN Theis, PM Solomon
Proceedings of the IEEE 98 (12), 2005-2014, 2010
264 2010 The future of interconnection technology TN Theis
IBM Journal of Research and Development 44 (3), 379-390, 2000
228 2000 Electron Localization by a Metastable Donor Level in TN Theis, PM Mooney, SL Wright
Physical review letters 60 (4), 361, 1988
221 1988 Electron heating in silicon dioxide and off‐stoichiometric silicon dioxide films DJ DiMaria, TN Theis, JR Kirtley, FL Pesavento, DW Dong, SD Brorson
Journal of applied physics 57 (4), 1214-1238, 1985
204 1985 Plasmons in inversion layers TN Theis
Surface Science 98 (1-3), 515-532, 1980
193 1980 Two-dimensional magnetoplasmon in the silicon inversion layer TN Theis, JP Kotthaus, PJ Stiles
Solid State Communications 24 (4), 273-277, 1977
143 1977 Effect of local alloy disorder on emission kinetics of deep donors (D X centers) in Alx 1−x As of low Al content PM Mooney, TN Theis, SL Wright
Applied physics letters 53 (25), 2546-2548, 1988
141 1988 Charge transport and trapping phenomena in off‐stoichiometric silicon dioxide films DJ DiMaria, DW Dong, C Falcony, TN Theis, JR Kirtley, JC Tsang, ...
Journal of Applied Physics 54 (10), 5801-5827, 1983
141 1983 Hot-electron picture of light emission from tunnel junctions JR Kirtley, TN Theis, JC Tsang, DJ DiMaria
Physical Review B 27 (8), 4601, 1983
131 1983 Noise spectroscopy of deep level (D X ) centers in GaAs‐Alx 1−x As heterostructures JR Kirtley, TN Theis, PM Mooney, SL Wright
Journal of applied physics 63 (5), 1541-1548, 1988
120 1988 Light emission from tunnel junctions on gratings J Kirtley, TN Theis, JC Tsang
Physical Review B 24 (10), 5650, 1981
115 1981 Surface plasmon polariton contributions to strokes emission from molecular monolayers on periodic Ag surfaces JC Tsang, JR Kirtley, TN Theis
Solid State Communications 35 (9), 667-670, 1980
110 1980 Wavevector dependence of the two-dimensional plasmon dispersion relationship in the (100) silicon inversion layer TN Theis, JP Kotthaus, PJ Stiles
Solid State Communications 26 (9), 603-606, 1978
97 1978 Quantum computing: An IBM perspective M Steffen, DP DiVincenzo, JM Chow, TN Theis, MB Ketchen
IBM Journal of Research and Development 55 (5), 13: 1-13: 11, 2011
92 2011 Diffraction‐grating‐enhanced light emission from tunnel junctions JR Kirtley, TN Theis, JC Tsang
Applied Physics Letters 37 (5), 435-437, 1980
85 1980 Strong Electric Field Heating of Conduction-Band Electrons in Si TN Theis, DJ DiMaria, JR Kirtley, DW Dong
Physical review letters 52 (16), 1445, 1984
79 1984 