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Chong Leong, Gan., Ph.D, FRSC, FInstP, FIOM3
Chong Leong, Gan., Ph.D, FRSC, FInstP, FIOM3
Micron Memory Taiwan Co Ltd
Verified email at broadcom.com - Homepage
Title
Cited by
Cited by
Year
Data clustering: theory, algorithms, and applications
G Gan, C Ma, J Wu
Society for Industrial and Applied Mathematics, 2020
25622020
Rainbow trapping in hyperbolic metamaterial waveguide
H Hu, D Ji, X Zeng, K Liu, Q Gan
Scientific reports 3 (1), 1249, 2013
2052013
Experimental verification of the rainbow trapping effect in adiabatic plasmonic gratings
Q Gan, Y Gao, K Wagner, D Vezenov, YJ Ding, FJ Bartoli
Proceedings of the National Academy of Sciences 108 (13), 5169-5173, 2011
1712011
Crumpled graphene triboelectric nanogenerators: smaller devices with higher output performance
H Chen, Y Xu, L Bai, Y Jiang, J Zhang, C Zhao, T Li, H Yu, G Song, ...
Advanced Materials Technologies 2 (6), 1700044, 2017
852017
Polymeric photovoltaics with various metallic plasmonic nanostructures
B Zeng, Q Gan, ZH Kafafi, FJ Bartoli
Journal of Applied Physics 113 (6), 2013
662013
Evolutions of bonding wires used in semiconductor electronics: perspective over 25 years
CL Gan, U Hashim
Journal of Materials Science: Materials in Electronics 26, 4412-4424, 2015
532015
Technical barriers and development of Cu wirebonding in nanoelectronics device packaging
CL Gan, EK Ng, BL Chan, U Hashim, FC Classe
Journal of Nanomaterials 2012, 96-96, 2012
472012
Extended reliability of gold and copper ball bonds in microelectronic packaging
CL Gan, C Francis, BL Chan, U Hashim
gold Bulletin 46, 103-115, 2013
412013
Wearout reliability and intermetallic compound diffusion kinetics of Au and PdCu wires used in nanoscale device packaging
CL Gan, EK Ng, BL Chan, FC Classe, T Kwuanjai, U Hashim
Journal of Nanomaterials 2013, 4-4, 2013
322013
Environmental friendly package development by using copper wirebonding
CL Gan, TT Toong, CP Lim, CY Ng
2010 34th IEEE/CPMT International Electronic Manufacturing Technology …, 2010
302010
Evolution and investigation of copper and gold ball bonds in extended reliability stressing
CL Gan, FC Classe, BL Chan, U Hashim
Gold Bulletin 47, 141-151, 2014
282014
Graded metallic gratings for ultrawideband surface wave trapping at THz frequencies
Q Gan, FJ Bartoli
IEEE Journal of Selected Topics in Quantum Electronics 17 (1), 102-109, 2010
282010
Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging
CL Gan, U Hashim
PLosOne 8 (11), 1-8, 2013
26*2013
Prognostics and Health Management of Electronics: Fundamentals, Machine Learning, and the Internet of Things: John Wiley & Sons Ltd.(2018). pp. 731, ISBN: 9781119515326 (Print …
CL Gan
Life Cycle Reliability and Safety Engineering 9 (2), 225-226, 2020
242020
Effects of bonding wires and epoxy molding compound on gold and copper ball bonds intermetallic growth kinetics in electronic packaging
CL Gan, FC Classe, BL Chan, U Hashim
Journal of electronic materials 43, 1017-1025, 2014
242014
Effect of palladium on the mechanical properties of Cu–Al intermetallic compounds
ABY Lim, X Long, L Shen, X Chen, RV Ramanujan, CL Gan, Z Chen
Journal of Alloys and Compounds 628, 107-112, 2015
222015
Future and technical considerations of gold wirebonding in semiconductor packaging–a technical review
C Leong Gan, F Classe, B Lee Chan, U Hashim
Microelectronics International 31 (2), 121-128, 2014
222014
Reliability challenges of Cu wire deployment in flash memory packaging
CL Gan, EK Ng, BL Chan, U Hashim
2012 7th International Microsystems, Packaging, Assembly and Circuits …, 2012
202012
The effects of multiple zincation process on aluminum bond pad surface for electroless nickel immersion gold deposition
MK Md Arshad, I Ahmad, A Jalar, G Omar, U Hashim
202006
Reliability assessment and mechanical characterization of Cu and Au ball bonds in BGA package
CL Gan, U Hashim
Journal of Materials Science: Materials in Electronics 24, 2803-2811, 2013
192013
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