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Daniel C. Edelstein
Daniel C. Edelstein
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Title
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Cited by
Year
Full copper wiring in a sub-0.25/spl mu/m CMOS ULSI technology
D Edelstein, J Heidenreich, R Goldblatt, W Cote, C Uzoh, N Lustig, ...
International Electron Devices Meeting. IEDM Technical Digest, 773-776, 1997
6771997
Copper metallization for high performance silicon technology
R Rosenberg, DC Edelstein, CK Hu, KP Rodbell
Annual review of materials science 30 (1), 229-262, 2000
5802000
Method for low temperature chemical vapor deposition of low-k films using selected cyclosiloxane and ozone gases for semiconductor applications
RA Conti, DC Edelstein, GY Lee
US Patent 7,084,079, 2006
5182006
RF circuit design aspects of spiral inductors on silicon
JN Burghartz, DC Edelstein, M Soyuer, HA Ainspan, KA Jenkins
IEEE Journal of Solid-State Circuits 33 (12), 2028-2034, 1998
3731998
Dual etch stop/diffusion barrier for damascene interconnects
DC Edelstein, TJ Dalton, JG Gaudiello, M Krishnan, SG Malhotra, ...
US Patent 6,153,935, 2000
3292000
Method for forming encapsulated metal interconnect structures in semiconductor integrated circuit devices
SC Seo, C Sambucetti, X Chen, Z Chen, V McGahay, D Edelstein
US Patent App. 10/026,176, 2003
2972003
Broadly tunable high repetition rate femtosecond optical parametric oscillator
DC Edelstein, ES Wachman, CL Tang
Applied Physics Letters 54 (18), 1728-1730, 1989
2931989
On-chip wiring design challenges for gigahertz operation
A Deutsch, PW Coteus, GV Kopcsay, HH Smith, CW Surovic, BL Krauter, ...
Proceedings of the IEEE 89 (4), 529-555, 2001
2762001
Method for forming Co-WP-Au films
CJ Sambucetti, JM Rubino, DC Edelstein, C Cabral Jr, GF Walker, ...
US Patent 6,323,128, 2001
2702001
Silicon chip carrier with conductive through-vias and method for fabricating same
DC Edelstein, PS Andry, LP Buchwalter, JA Casey, SA Goma, RR Horton, ...
US Patent 7,276,787, 2007
2662007
Copper interconnection structure incorporating a metal seed layer
DC Edelstein, JME Harper, CK Hu, AH Simon, CE Uzoh
US Patent 6,181,012, 2001
2242001
Integrated circuit inductor
JN Burghartz, DC Edelstein, CV Jahnes, CE Uzoh
US Patent 5,884,990, 1999
2171999
Spiral inductors and transmission lines in silicon technology using copper-damascene interconnects and low-loss substrates
JN Burghartz, DC Edelstein, KA Jenkiin, YH Kwark
IEEE Transactions on Microwave Theory and Techniques 45 (10), 1961-1968, 1997
2031997
Microelectronic structure including air gap
DC Edelstein, DV Horak, EE Huang, SV Nitta, T Nogami, S Ponoth, ...
US Patent 8,288,268, 2012
2022012
Integrated circuit toroidal inductor
JN Burghartz, DC Edelstein, CV Jahnes, CE Uzoh
US Patent 5,793,272, 1998
2001998
Advantages of copper interconnects
DC Edelstein
Proceedings of the 12th International IEEE VLSI Multilevel Interconnection …, 1995
1991995
VLSI on-chip interconnection performance simulations and measurements
DC Edelstein, GA Sai-Halasz, YJ Mii
IBM Journal of Research and Development 39 (4), 383-401, 1995
1781995
Integrated circuit spiral inductor
JN Burghartz, DC Edelstein, CV Jahnes, CE Uzoh
US Patent 6,114,937, 2000
1702000
Apparatus and method for the electrochemical etching of a wafer
M Datta, DC Edelstein, CE Uzoh
US Patent 6,103,096, 2000
1562000
Continuous-wave mode-locked and dispersion-compensated femtosecond optical parametric oscillator
ES Wachman, DC Edelstein, CL Tang
Optics letters 15 (2), 136-138, 1990
1531990
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